Publications

Showing records 1 - 20 (of 75)

Publication: Authored Book (Verfasser eines eigenständigen Buches)

ID	Author	Year	Title	Publisher
4496432	Sadewasser, Sascha; Glatzel, Thilo	2018	Kelvin Probe Force Microscopy - From Single Charge Detection to Device Characterization	Springer International Publishing

Publication: Book Item (Buchkap., Lexikonartikel, jur. Kommentierung, Beiträge in Sammelbänden etc.)

ID	Author	Year	Title	Publisher
3395476	Glatzel, Thilo	2015	Mechanical and electrical properties of single molecules	Springer International Publishing
3395489	Pawlak, Rémy; Kawai, Shigeki; Glatzel, Thilo; Meyer, Ernst	2015	Single molecule force spectroscopy	Springer International Publishing
4496440	Gnecco, Enrico; Pawlak, Remy; Kisiel, Marcin; Glatzel, Thilo; Meyer, Ernst	2017	Atomic Scale Friction Phenomena	Springer
4611407	Gnecco, Enrico; Pawlak, Remy; Glatzel, Thilo; Meyer, Ernst	2020	Atomic-scale investigations of ultralow friction on crystal surfaces in ultrahigh vacuum	Elsevier
4665667	Gnecco, Enrico; Pawlak, Rémy; Glatzel, Thilo; Meyer, Ernst	2021	Chapter 5 - Atomic-scale investigations of ultralow friction on crystal surfaces in ultrahigh vacuum	Elsevier

Publication: JournalArticle (Originalarbeit in einer wissenschaftlichen Zeitschrift)

ID	Author	Year	Title	Publisher
2093627	Henning, Alex; Günzburger, Gino; Jöhr, Res; Rosenwaks, Yossi; Bozic-Weber, Biljana; Housecroft, Catherine E; Constable, Edwin C; Meyer, Ernst; Glatzel, Thilo	2013	Kelvin Probe Force Microscopy of Nanocrystalline TiO2 Photoelectrodes	Beilstein Journal of Nanotechnology
2301372	Eren, Baran; Glatzel, Thilo; Kisiel, Marcin; Fu, Wangyang; Pawlak, Rémy; Gysin, Urs; Nef, Cornelia; Marot, Laurent; Calame, Michel; Schönenberger, Christian; Meyer, Ernst	2013	Hydrogen plasma microlithography of graphene supported on a Si/SiO2 substrate	Applied physics letters
3395477	Glatzel, Thilo; Garcia, Ricardo; Schimmel, Thomas	2014	Advanced atomic force microscopy techniques II	Beilstein Journal of Nanotechnology
3395485	Kawai, Shigeki; Sadeghi, Ali; Xu, Feng; Peng, Lifen; Pawlak, Rémy; Glatzel, Thilo; Willand, Alexander; Orita, Akihiro; Otera, Junzo; Goedecker, Stefan; Meyer, Ernst	2014	Correction to Obtaining Detailed Structural Information about Supramolecular Systems on Surfaces by Combining High-Resolution Force Microscopy with ab Initio Calculations	ACS Nano
2832299	Fessler, Gregor; Eren, Baran; Gysin, Urs; Glatzel, Thilo; Meyer, Ernst	2014	Friction force microscopy studies on SiO2 supported pristine and hydrogenated graphene	Applied physics letters
3395481	Hug, Hubert; Bader, Michael; Mair, Peter; Glatzel, Thilo	2014	Biophotovoltaics: Natural pigments in dye-sensitized solar cells	Applied Energy
2359086	Eren, B.; Marot, L.; Guenzburger, G.; Renault, P.-O.; Glatzel, Th; Steiner, R.; Meyer, E.	2014	Hydrogen-induced buckling of gold films	Journal of physics. D, Applied physics
2703472	Kawai, Shigeki; Koch, Matthias; Gnecco, Enrico; Sadeghi, Ali; Pawlak, Rémy; Glatzel, Thilo; Schwarz, Jutta; Goedecker, Stefan; Hecht, Stefan; Baratoff, Alexis; Grill, Leonhard; Meyer, Ernst	2014	Quantifying the atomic-level mechanics of single long physisorbed molecular chains	Proceedings of the National Academy of Sciences of the United States of America
2311526	Martin, Colin J.; Bozic-Weber, Biljana; Constable, Edwin C.; Glatzel, Thilo; Housecroft, Catherine E.; Wright, Iain A.	2014	Development of scanning electrochemical microscopy (SECM) techniques for the optimization of dye sensitized solar cells	Electrochimica acta
2615898	Martin, C. J.; Bozic-Weber, B.; Constable, E. C.; Glatzel, T.; Housecroft, C. E.; Wright, I. A.	2014	Using scanning electrochemical microscopy as a tool to examine copper(I) sensitizers for dye sensitized solar cells	Journal of Physical Chemistry C
3347087	Olszowski, Piotr; Zajac, Lukasz; Godlewski, Szymon; Such, Bartosz; Joehr, Res; Glatzel, Thilo; Meyer, Ernst; Szymonski, Marek	2015	Role of a Carboxyl Group in the Adsorption of Zn Porphyrins on TiO2(011)-2x1 Surface	The Journal of Physical Chemistry C
3395479	Gysin, Urs; Glatzel, Thilo; Schmölzer, Thomas; Schöner, Adolf; Reshanov, Sergey; Bartolf, Holger; Meyer, Ernst	2015	Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices	Beilstein Journal of Nanotechnology
3395493	Rossmann, H. R.; Gysin, Urs; Bubendorf, Alexander; Glatzel, Thilo; Reshanov, Sergey; Schoner, Adolf; Jung, T. A.; Meyer, Ernst; Bartolf, Holger	2015	Two-Dimensional Carrier Profiling on Lightly Doped n-Type 4H-SiC Epitaxially Grown Layers	Materials Science Forum
3347088	Joehr, Res; Hinaut, Antoine; Pawlak, Remy; Sadeghi, Ali; Saha, Santanu; Goedecker, Stefan; Such, Bartosz; Szymonski, Marek; Meyer, Ernst; Glatzel, Thilo	2015	Characterization of individual molecular adsorption geometries by atomic force microscopy: Cu-TCPP on rutile TiO2 (110)	Journal of Chemical Physics

Showing records 1 - 20 (of 75)