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Kelvin Probe Force Microscopy - From Single Charge Detection to Device Characterization
Authored Book (Verfasser eines eigenständigen Buches)
 
ID 4496432
Author(s) Sadewasser, Sascha; Glatzel, Thilo
Author(s) at UniBasel Glatzel, Thilo
Year 2018
Title Kelvin Probe Force Microscopy - From Single Charge Detection to Device Characterization
Publisher Springer International Publishing
Place of Publication Cham
ISSN/ISBN 0931-5195 ; 2198-4743 ; 978-3-319-75686-8 ; 978-3-319-75687-5
Series title Springer Series in Surface Sciences book series
Volume 65
Digital Object Identifier DOI 10.1007/978-3-319-75687-5
edoc-URL https://edoc.unibas.ch/68810/
Full Text on edoc No
 
   

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