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AFM study of defect-induced depressions of the smectic-A/air interface.
JournalArticle (Originalarbeit in einer wissenschaftlichen Zeitschrift)
 
ID 761041
Author(s) Designolle, V.; Herminghaus, S.; Pfohl, T.; Bahr, Ch
Author(s) at UniBasel Pfohl, Thomas
Year 2006
Title AFM study of defect-induced depressions of the smectic-A/air interface.
Journal Langmuir
Volume 22
Number 1
Pages / Article-Number 363-8
Abstract The smectic-A/air interface of liquid-crystal droplets with antagonistic boundary conditions is studied by atomic force microscopy (AFM). The droplets are prepared on coated silicon wafers on which a planar alignment is preferred in contrast to the homeotropic alignment at the air interface. As a result, focal conic defects appear in the smectic-A phase causing a characteristic pattern of depressions in the droplet surface. The dimensions of the defect-induced depressions are measured by AFM as a function of temperature for two different compounds possessing a smectic-A-isotropic and a smectic-A-nematic transition. Whereas the results are independent of temperature in the smectic-A-isotropic case, reflecting the first-order nature of the transition, a pronounced temperature dependence is observed for the second compound, where the depth of the defect-induced depressions decreases continuously with increasing temperature and vanishes at the second-order transition to the nematic phase. These observations can be qualitatively explained through the behavior of the layer compressional elastic constant at the smectic-A-nematic transition.
Publisher American Chemical Society
ISSN/ISBN 0743-7463
edoc-URL http://edoc.unibas.ch/45899/
Full Text on edoc No
Digital Object Identifier DOI 10.1021/la0525224
PubMed ID http://www.ncbi.nlm.nih.gov/pubmed/16378446
ISI-Number WOS:000234410300059
Document type (ISI) Journal Article
 
   

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