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Suppression of Surface-Related Loss in a Gated Semiconductor Microcavity
JournalArticle (Originalarbeit in einer wissenschaftlichen Zeitschrift)
 
ID 4636311
Author(s) Najer, Daniel; Tomm, Natasha; Javadi, Alisa; Korsch, Alexander R.; Petrak, Benjamin; Riedel, Daniel; Dolique, Vincent; Valentin, Sascha R.; Schott, Rudiger; Wieck, Andreas D.; Ludwig, Arne; Warburton, Richard J.
Author(s) at UniBasel Warburton, Richard
Year 2021
Title Suppression of Surface-Related Loss in a Gated Semiconductor Microcavity
Journal Physical review applied
Volume 15
Number 4
Pages / Article-Number 044004
Abstract We present a surface-passivation method that reduces surface-related losses by almost 2 orders of magnitude in a highly miniaturized GaAs open microcavity. The microcavity consists of a curved dielectric distributed Bragg reflector with radius of approximately 10 ?m paired with a GaAs-based heterostructure. The heterostructure consists of a semiconductor distributed Bragg reflector followed by an n-i-p diode with a layer of quantum dots in the intrinsic region. Free-carrier absorption in the highly -n-doped and highly -p-doped layers is minimized by our positioning them close to a node of the vacuum electromagnetic field. The surface, however, resides at an antinode of the vacuum field and results in significant loss. These losses are much reduced by surface passivation. The strong dependence on wavelength implies that the main effect of the surface passivation is to eliminate the surface electric field, thereby quenching below-band-gap absorption via a Franz-Keldysh-like effect. An additional benefit is that the surface passivation reduces scattering at the GaAs surface. These results are important in other nanophotonic devices that rely on a GaAs-vacuum interface to confine the electromagnetic field.
Publisher American Physical Society
ISSN/ISBN 2331-7019
edoc-URL https://edoc.unibas.ch/86162/
Full Text on edoc Available
Digital Object Identifier DOI 10.1103/PhysRevApplied.15.044004
ISI-Number 000651426900004
Document type (ISI) Article
 
   

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