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Algorithm-Based Fault Tolerance for Parallel Stencil Computations
ConferencePaper (Artikel, die in Tagungsbänden erschienen sind)
 
ID 4528236
Author(s) Cavelan, Aurélien; Ciorba, Florina M.
Author(s) at UniBasel Cavelan, Aurélien
Ciorba, Florina M.
Year 2019
Title Algorithm-Based Fault Tolerance for Parallel Stencil Computations
Book title (Conference Proceedings) 2019 IEEE International Conference on Cluster Computing
Place of Conference Albuquerque, NM, USA
Year of Conference 2019
Publisher IEEE
Pages 1-11
ISSN/ISBN 1552-5244 ; 2168-9253 ; 978-1-7281-4734-5 ; 978-1-7281-4735-2
Keywords astronomy computing , computational fluid dynamics , flow simulation , hydrodynamics , interpolation , parallel processing
Abstract The increase in HPC systems size and complexity, together with increasing on-chip transistor density, power limitations, and number of components, render modern HPC systems subject to soft errors. Silent data corruptions (SDCs) are typically caused by such soft errors in the form of bit-flips in the memory subsystem and hinder the correctness of scientific applications. This work addresses the problem of protecting a class of iterative computational kernels, called stencils, against SDCs when executing on parallel HPC systems. Existing SDC detection and correction methods are in general either inaccurate, inefficient, or targeting specific application classes that do not include stencils. This work proposes a novel algorithm-based fault tolerance (ABFT) method to protect scientific applications that contain arbitrary stencil computations against SDCs. The ABFT method can be applied both online and offline to accurately detect and correct SDCs in 2D and 3D parallel stencil computations. We present a formal model for the proposed method including theorems and proofs for the computation of the associated check-sums as well as error detection and correction. We experimentally evaluate the use of the proposed ABFT method on a real 3D stencil-based application (HotSpot3D) via a fault-injection, detection, and correction campaign. Results show that the proposed ABFT method achieves less than 8% overhead compared to the performance of the unprotected stencil application. Moreover, it accurately detects and corrects SDCs. While the offline ABFT version corrects errors more accurately, it may incur a small additional overhead than its online counterpart.
URL https://doi.org/10.1109/CLUSTER.2019.8891034
edoc-URL https://edoc.unibas.ch/75268/
Full Text on edoc No
Digital Object Identifier DOI 10.1109/CLUSTER.2019.8891034
 
   

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