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Atomic-Scale Analysis of the SiC/Oxide Interface to Improve-High-Power MOSFET Devices
Thesis (Dissertationen, Habilitationen)
 
ID 4508677
Author Dutta, Dipanwita
Author at UniBasel Dutta, Dipanwita
Year 2019
Title Atomic-Scale Analysis of the SiC/Oxide Interface to Improve-High-Power MOSFET Devices
Type of Thesis Dissertation
Start of thesis 01.06.2015
End of thesis 12.06.2019
Name of University University of Basel
Name of Faculty Philosophisch-Naturwissenschaftliche Fakultät
Supervisor(s) / Fachvertreter/in Jung, Thomas
Full Text on edoc
   

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