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Ambipolar quantum dots in undoped silicon fin field-effect transistors
JournalArticle (Originalarbeit in einer wissenschaftlichen Zeitschrift)
 
ID 4498798
Author(s) Kuhlmann, Andreas V.; Deshpande, Veeresh; Camenzind, Leon C.; Zumbuhl, Dominik M.; Fuhrer, Andreas
Author(s) at UniBasel Zumbühl, Dominik
Year 2018
Title Ambipolar quantum dots in undoped silicon fin field-effect transistors
Journal APPLIED PHYSICS LETTERS
Volume 113
Number 12
Pages / Article-Number 122107
Abstract

We integrate ambipolar quantum dots in silicon fin field-effect transistors using exclusively standard complementary metal-oxide-semiconductor fabrication techniques. We realize ambipolarity by replacing conventional highly doped source and drain electrodes by a metallic nickel silicide with the Fermi level close to the silicon mid-gap position. Such devices operate in a dual mode, as either a classical field-effect or single-electron transistor. We implement a classical logic NOT gate at low temperature by tuning two interconnected transistors into opposite polarities. In the quantum regime, we demonstrate stable quantum dot operation in the few charge carrier Coulomb blockade regime for both electrons and holes. Published by AIP Publishing.

Publisher AMER INST PHYSICS
ISSN/ISBN 0003-6951
Full Text on edoc
Digital Object Identifier DOI 10.1063/1.5048097
ISI-Number ISI:000445366200027
Document type (ISI) Article
   

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