Atomic resolution at ambient conditions atomic force microscope (ARAC AFM)
Third-party funded project
Project title Atomic resolution at ambient conditions atomic force microscope (ARAC AFM)
Principal Investigator(s) Meyer, Ernst
Co-Investigator(s) Schönenberger, Christian
Organisation / Research unit Departement Physik / Nanomechanik (Meyer)
Project Website nanolino.unibas.ch
Project start 01.04.2017
Probable end 31.03.2019
Status Active
Abstract

 

Max. 480 characters for publication purposes
An AFM will be developed, which easily and reliably provides atomic resolution at ambient conditions (ARAC AFM). To achieve this goal we use the so called qPlus sensor, which is by orders of magnitude more sensitive for operation on the atomic scale. It allows a more stable operation, resulting in a much greater ease of use than conventional AFM. The value of the technology is demonstrated by showing atomically resolved images of nanostructures and 2D materials.

Max. 480 characters for publication purposesAn AFM will be developed, which easily and reliably provides atomic resolution at ambient conditions (ARAC AFM). To achieve this goal we use the so called qPlus sensor, which is by orders of magnitude more sensitive for operation on the atomic scale. It allows a more stable operation, resulting in a much greater ease of use than conventional AFM. The value of the technology is demonstrated by showing atomically resolved images of nanostructures and 2D materials.

 

Financed by Innovation Promotion Agency CTI
   

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