Bimodal magnetic force microscopy with capacitive tip-sample distance control

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Bimodal magnetic force microscopy with capacitive tip-sample distance control

JournalArticle (Originalarbeit in einer wissenschaftlichen Zeitschrift)

ID	3405869
Author(s)	Schwenk, J.; Zhao, X.; Bacani, M.; Marioni, M. A.; Romer, S.; Hug, H. J.
Author(s) at UniBasel	Hug, Hans Josef
Year	2015
Title	Bimodal magnetic force microscopy with capacitive tip-sample distance control
Journal	Applied physics letters
Volume	107
Number	13
Pages / Article-Number	132407
Abstract	A single-passage, bimodal magnetic force microscopy technique optimized for scanning samples with arbitrary topography is discussed. A double phase-locked loop (PLL) system is used to mechanically excite a high quality factor cantilever under vacuum conditions on its first mode and via an oscillatory tip-sample potential on its second mode. The obtained second mode oscillation amplitude is then used as a proxy for the tip-sample distance, and for the control thereof. With appropriate z-feedback parameters two data sets reflecting the magnetic tip-sample interaction and the sample topography are simultaneously obtained.
Publisher	American Institute of Physics
ISSN/ISBN	0003-6951
edoc-URL	http://edoc.unibas.ch/44024/
Full Text on edoc	Available
Digital Object Identifier DOI	10.1063/1.4932174
ISI-Number	WOS:000362575600031
Document type (ISI)	Article

09/05/2024

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