Advanced atomic force microscopy techniques II
JournalArticle (Originalarbeit in einer wissenschaftlichen Zeitschrift)
 
ID 3395477
Author(s) Glatzel, Thilo; Garcia, Ricardo; Schimmel, Thomas
Author(s) at UniBasel Glatzel, Thilo
Year 2014
Title Advanced atomic force microscopy techniques II
Journal Beilstein Journal of Nanotechnology
Volume 5
Pages / Article-Number 2326-7
Publisher Beilstein-Institut
ISSN/ISBN 2190-4286
edoc-URL http://edoc.unibas.ch/41468/
Full Text on edoc No
Digital Object Identifier DOI 10.3762/bjnano.5.241
PubMed ID http://www.ncbi.nlm.nih.gov/pubmed/25551060
ISI-Number WOS:000346613000001
Document type (ISI) Journal Article
 
   

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