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Atomic force microscopy : general aspects and application to insulators
JournalArticle (Originalarbeit in einer wissenschaftlichen Zeitschrift)
 
ID 171290
Author(s) HEINZELMANN, H; MEYER, E; GRUTTER, P; HIDBER, HR; ROSENTHALER, L; GUNTHERODT, HJ
Author(s) at UniBasel Meyer, Ernst
Year 1988
Title Atomic force microscopy : general aspects and application to insulators
Journal Journal of vacuum science & technology. A, Vacuum, surfaces and films
Volume 6
Number 2
Pages / Article-Number 275-278
Publisher American Vacuum Society
ISSN/ISBN 0734-2101
edoc-URL http://edoc.unibas.ch/dok/A5262173
Full Text on edoc No
Digital Object Identifier DOI 10.1116/1.575424
ISI-Number WOS:A1988M650200020
Document type (ISI) Article
 
   

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