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Bidirectional force microscope for surface-analysis in ultrahigh-vacuum
Journal
Helvetica physica acta
Volume
65
Number
6
Pages / Article-Number
868-869
Abstract
A scanning force microscope for remote controlled operation in ultra high vacuum is described. The normal and lateral forces, acting on the sensor, can be measured simultaneously with the tunneling current between sensor tip and sample. The optical beam deflection detector and the sample position. can be adjusted by means of three compact inertial stepping motors.
