Logo der Universität Basel

Research Database / FORSCHUNGSDATENBANK 
PRINTDOC
 
Publication 171232 | Verified
 

Data Entry: Please note that the research database will be replaced by UNIverse by the end of October 2023. Please enter your data into the system https://universe-intern.unibas.ch. Thanks

Login for users with Unibas email account...

Login for registered users without Unibas email account...

 
Atomic-force microscopy on the Si(111) 7x7 surface
JournalArticle (Originalarbeit in einer wissenschaftlichen Zeitschrift)
 
ID 171232
Author(s) HOWALD, L; LUTHI, R; MEYER, E; GUNTHERODT, HJ
Author(s) at UniBasel Meyer, Ernst
Year 1995
Title Atomic-force microscopy on the Si(111) 7x7 surface
Journal Physical Review B
Volume 51
Number 8
Pages / Article-Number 5484-5487
Publisher American Institute of Physics
ISSN/ISBN 0163-1829
edoc-URL http://edoc.unibas.ch/dok/A5839483
Full Text on edoc No
Digital Object Identifier DOI 10.1103/PhysRevB.51.5484
ISI-Number WOS:A1995QP75800099
Document type (ISI) Note
 
   

MCSS v5.8 PRO. 0.334 sec, queries - 0.000 sec ©Universität Basel  |  Impressum   |    
20/04/2024