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Ubiquitous mechanisms of energy dissipation in noncontact atomic force microscopy
JournalArticle (Originalarbeit in einer wissenschaftlichen Zeitschrift)
 
ID 171122
Author(s) Ghasemi, S Alireza; Goedecker, Stefan; Baratoff, Alexis; Lenosky, Thomas; Meyer, Ernst; Hug, Hans J
Author(s) at UniBasel Meyer, Ernst
Goedecker, Stefan
Hug, Hans Josef
Ghasemi, Seyed Alireza
Year 2008
Title Ubiquitous mechanisms of energy dissipation in noncontact atomic force microscopy
Journal Physical review letters
Volume 100
Number 23
Pages / Article-Number 236106
Abstract

Atomistic simulations considering larger tip structures than hitherto assumed reveal novel dissipation mechanisms in noncontact atomic force microscopy. The potential energy surfaces of realistic silicon tips exhibit many energetically close local minima that correspond to different structures. Most of them easily deform, thus causing dissipation arising from hysteresis in force versus distance characteristics. Furthermore, saddle points which connect local minima can suddenly switch to connect different minima. Configurations driven into metastability by the tip motion can thus suddenly access lower energy structures when thermal activation becomes allowed within the time required to detect the resulting average dissipation.

Publisher American Physical Society
ISSN/ISBN 0031-9007
edoc-URL http://edoc.unibas.ch/dok/A5262101
Full Text on edoc No
Digital Object Identifier DOI 10.1103/PhysRevLett.100.236106
PubMed ID http://www.ncbi.nlm.nih.gov/pubmed/18643523
ISI-Number WOS:000256708100051
Document type (ISI) Article
 
   

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